The MSE Department, in collaboration with the CCOMC under the direction of Professor Haber, has acquired a state of the art Field Emission Scanning Electron Microscope with exceptional capabilities that will enhance materials research throughout the school and across the campus. The instrument, valued at more than $1.4M, is a Zeiss Gemini 300 Nano-VP equipped with three secondary detectors, two backscattered detectors, a STEM detector, an EBS Detector, as well as many other accessories and operational features. From a spectroscopy perspective the machine is fitted with multiple Oxford detectors, both energy dispersive (EDS) and wavelength dispersive (WDS) that will enable a high level of elemental detection. Furthermore, a Quorum cold stage will provide cryogenic capbilities essential for many biological and soft materials. This machine also has unusually high spatial resolution for a FESEM with magnifications up to 2,000,000X, comparable to many TEM instruments.
In combination with the NION UltraSTEM in Phil Batson's group, the two machines will give Rutgers broad electron microscopy and analytical capability to enhance the breadth and level of materials research in the Department and across the university. The system should arrive by August 1 and be operational in the fall. The facility will be located in a completely renovated quiet laboratory in the Center for Ceramics Research, adjacent the the MSE X-ray diffraction laboratory, the Zeiss Sigma FESEM, the Park AFM, and the Delong TEM.